Characterization of a New Resistor System for Advanced Multilayer Technology Materials
- 著者名:
- Anderson,David K. ( DuPont Electronic Materials )
- Smith,J.D.
- Needes,C.R.S.
- Horowitz,S.J.
- 掲載資料名:
- Proceedings : 1999 International Symposium on Microelectronics : 26-28 October 1999, Chicago, Illinois
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3906
- 発行年:
- 1999
- 開始ページ:
- 118
- 終了ページ:
- 123
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780930815585 [0930815580]
- 言語:
- 英語
- 請求記号:
- P63600/3906
- 資料種別:
- 国際会議録
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