Depth measurement of moving slurry at the wet end of a paper machine
- 著者名:
- Goddard,J.S.,Jr. ( Oak Ridge National Lab. )
- Sari-Sarraf,H.
- Turner,J.C.
- Hunt,M.A.
- Abidi,B.R.
- 掲載資料名:
- Machine vision applications in industrial inspection VII : 25-26 January 1999, San Jose, California
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3652
- 発行年:
- 1999
- 開始ページ:
- 21
- 終了ページ:
- 27
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819431233 [0819431230]
- 言語:
- 英語
- 請求記号:
- P63600/3652
- 資料種別:
- 国際会議録
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12
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Direct to digital holography for semiconductor wafer defect detection and review(Invited Paper)
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