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Optical anisotropy of GaN/sapphire studied by generalized ellipsometry and Raman scattering

著者名:
Yan,C. ( Univ.of Nebraska/Lincoln )
Yao,H.W.
Hove,J.M.Van
Wowchak,A.M.
Chow,P.P.
Zavada,J.M.
さらに 1 件
掲載資料名:
Light-emitting diodes : research, manufacturing, and applications III : 27-28 January 1999, San Jose, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3621
発行年:
1999
開始ページ:
73
終了ページ:
84
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430915 [0819430919]
言語:
英語
請求記号:
P63600/3621
資料種別:
国際会議録

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