Sample and data processing considerations for the NIST quantitative infrared database

Sample and data processing considerations for the NIST quantitative infrared database

著者名:

Chu,P.M. ( National Institute of Standards and Technology )
Guenther,F.R.
Rhoderick,G.C.
Lafferty,W.J.
Phillips,W.J.

掲載資料名:

Environmental monitoring and remediation technologies : 2-5 November 1998, Boston, Massachusetts

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3534

発行年:

1999

開始ページ:

204

終了ページ:

211

出版情報:

Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819429957 [0819429953]

言語:

英語

請求記号:

P63600/3534

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018990
シリーズID:	PA00000029
会議名:	Photonics East : Environmental monitoring and remediation technologies
回次:	1998
会議開催地:	Boston, MA, USA
会議開催年:	1998.11.02-1998.11.05

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