Study of 5-mask TFT array process with low-cost high-yield high-performance characteristics

Study of 5-mask TFT array process with low-cost high-yield high-performance characteristics

著者名:

Chen,J.-H. ( Industrial Technology Research Institute )
Huang,T.-H.
Lu,I-M.
Chen,P.-F.
Chen,D.-I

掲載資料名:

Display technologies III : 26-27 July 2000, Taipei, Taiwan

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4079

発行年:

2000

開始ページ:

210

終了ページ:

216

出版情報:

Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819437181 [0819437182]

言語:

英語

請求記号:

P63600/4079

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018983
シリーズID:	PA00000029
会議名:	Photonics Taiwan : Display technologies
回次:	2000 : 3rd
会議開催地:	Taipei, Taiwan
会議開催年:	2000.07.26-2000.07.27

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