Test structures for CMOS-compatible silicon pressure sensor reliability characterization
- 著者名:
- Montane,E. ( Univ.de Barcelona )
- Bota,S.A.
- Marco,S.
- Carmona,M.
- Samitier,J.
- 掲載資料名:
- Design, Test, Integration, and Packaging of MEMS/MOEMS : 9-11 May 2000, Paris, France
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4019
- 発行年:
- 2000
- 開始ページ:
- 250
- 終了ページ:
- 256
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819436450 [0819436453]
- 言語:
- 英語
- 請求記号:
- P63600/4019
- 資料種別:
- 国際会議録
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