Blank Cover Image

AN IN SITU TRANSMISSION ELECTRON MICROSCOPY STUDY DURING NH3 AMBIENT ANNEALING OF Cu-Cr THIN FILMS

著者名:
掲載資料名:
Mechanisms of thin film evolution
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
317
発行年:
1994
開始ページ:
245
出版情報:
Pittsburgh, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992160 [1558992162]
言語:
英語
請求記号:
M23500/317
資料種別:
国際会議録

類似資料:

1 国際会議録 IN SITU STUDIES OF NITRIDATION OF Cu/Ti THIN FILMS USING ENVIRONMENTAL CELL IN TRANSMISSION ELECTRON MICROSCOPY

Sharma, R., Atzmon, Z., Mayer, J., Hong, S. Q.

MRS - Materials Research Society
7 国際会議録 TRANSMISSION ELECTRON MICROSCOPY STUDY OF MOD PLZT AND PNZT THIN FILMS

Chang, J-F., Kwok, C.K., Desu, S.B.

Materials Research Society
2 国際会議録 KINETICS OF COPPER GRAIN GROWTH DURING NITRIDATION OF Cu-Cr AND Cu-Ti THIN FILMS BY IN SITU TEM

Atzmon, Z., Sharma, R., Russell, S. W., Mayer, J. W.

MRS - Materials Research Society
8 国際会議録 Transmission Electron Microscopy Studies of GaAs/ Ge Interfaces

Kishore, R., Sood, K.N., Singh, Sukhvir, Sharma, S.K., Tyagi, R., Singh, M., Agarwal, S.K.

SPIE-The International Society for Optical Engineering
3 国際会議録 Transmission-Electron-Microscopy Study of YBa2Cu3O7-x Thin-Film Multilayer Devices

Barnett, M. A., Abell, J. S., Aindow, M., Chew, N. G., Hirst, P. J., Humphreys, R. G.

MRS - Materials Research Society
9 国際会議録 TRANSMISSION ELECTRON MICROSCOPY AND X-RAY DIFFRACTION STUDIES OF a,b-AXIS ORIENTED YBa2Cu3O7-δ FILMS

Streiffer, S.K., Lairson, B.M., Zielinski, E.M., Bravman, J.C.

Materials Research Society
4 国際会議録 INVESTIGATIONS OF MICROSTRUCTURAL CHANGES IN NICKEL THIN FILMS ON ION-IMPLANTED SILICON BY CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPY WITH INTERMITTENT …

Lu, S. W., Nieh, C W., Chang, C. S., Chen, L.J.

Materials Research Society
10 国際会議録 IN SITU OBSERVATIONS OF BEAM-INDUCED EFFECTS DURING HIGH-RESOLUTION ELECTRON MICROSCOPY

Smith, David J., Lu, Ping, McCartney, M.R., Sharma, R.

Materials Research Society
5 国際会議録 IN-SITU DYNAMIC HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY INVESTIGATION OF GUEST-LAYER BEHAVIOR DURING DEINTERCALATION OF MERCURY TITANIUM DISULFIDE

McKelvy, M., Sidorov, M., Marie, A., Sharma, R., Glaunsinger, W. S.

MRS - Materials Research Society
11 国際会議録 TRANSMISSION ELECTRON MICROSCOPY STUDY OF DIAMOND FILMS GROWN BY PLASMA DEPOSITION

Wong, M.S., Chiou,W.A., Chen, F.R., Li, D.X., Chang, R.P.H.

Materials Research Society
6 国際会議録 IN-SITU TRANSMISSION ELECTRON MICROSCOPY AND COMPUTER SIMULATIN STUDY OF THE KINETICS OF OXYGEN LOSS IN YBa2Cu3Oz

Burmester, C.P., Willie, L.T., Gronsky, R., Ahn, B.T., Lee, V.Y., Beyers, R., Gur, T.M., Huggins,. R.A.

Materials Research Society
12 国際会議録 Interdiffusion and stress evolution during solid-state amorphization in Ni-Hf thin-film diffusion couples

Atzmon, M., Boyer, W.S.L.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12