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Degree of Crystallinity and Strain in B4C and SiC Thin Films as a Function of Processing Conditions

著者名:
掲載資料名:
Applications of synchrotron radiation techniques to materials science IV : sympoisum held April 13-17, 1998, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
524
発行年:
1998
開始ページ:
109
出版情報:
Warrendale, Penn.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994300 [1558994300]
言語:
英語
請求記号:
M23500/524
資料種別:
国際会議録

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