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Influence of Structural Defects and Zinc Composition Variation on the Device Response of Cd1-x ZnxTe Radiation Detectors

著者名:
Yoon, H.
Scyoc, J. M. Van
Gilbert, T. S.
Goorsky, M. S.
Brunett, B. A.
Lund, J. C.
Hermon, H.
Schieber, M.
James, R. B.
さらに 4 件
掲載資料名:
Infrared applications of semiconductors II : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
484
発行年:
1998
開始ページ:
241
出版情報:
Pittsburgh, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993891 [1558993894]
言語:
英語
請求記号:
M23500/484
資料種別:
国際会議録

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