Study of Electrical Transport Across Interfaces Between Wide-Gap Semiconductor and Metal Oxides | 東京工業大学附属図書館文献データベース

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Study of Electrical Transport Across Interfaces Between Wide-Gap Semiconductor and Metal Oxides

著者名:

さらに 5 件

掲載資料名:

Epitaxial oxide thin films III : symposium held March 31-April 2, 1997, San Francisco, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

474

発行年:

1997

開始ページ:

119

出版情報:

Pittsburgh, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558993785 [1558993789]

言語:

英語

請求記号:

M23500/474

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018913
シリーズID:	PA00000011
会議名:	Epitaxial oxide thin films
回次:	3rd
会議開催地:	San Francisco, California, U.S.A.
会議開催年:	1997.03.31-1997.04.02

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