Studies of Degradation in Nichia AlGaN/InGaN/GaN Blue Light Emitting Diodes Under Close to Normal Operating Conditions

Studies of Degradation in Nichia AlGaN/InGaN/GaN Blue Light Emitting Diodes Under Close to Normal Operating Conditions

著者名:

Osinski, M.

掲載資料名:

Compound semiconductor electronics and photonics : symposium held April 8-10, 1996, San Francisco, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

421

発行年:

1996

開始ページ:

183

出版情報:

Pittsburgh, Penn: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558993242 [155899324X]

言語:

英語

請求記号:

M23500/421

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018908
シリーズID:	PA00000011
会議名:	Symposium on compound semiconductor electronics and photonics
回次:	1996
会議開催地:	San Francisco, CA, USA
会議開催年:	1996.04.08-1996.04.10

類似資料:

1 国際会議録 Life tests of Nichia AlGaN/InGaN/GaN blue-light-emitting diodes Helms,C.J., Berg,N.H., Barton,D.L., Osinski,M. SPIE-The International Society for Optical Engineering	7 国際会議録 Electrical Properties of Nichia AlGaN/InGaN/GaN Blue LEDs in a Wide Current/Tenperature Range Zeller, Joachim, Eliseev, Petr G., Sartori, Philippe, Perlin, Piotr, Osinski, Marek MRS - Materials Research Society
2 国際会議録 Room-Temperature Life Test of Nichia AlGaN/InGaN/GaN Blue Light Emitting Diodes Osinski, Marek, Helms, Christopher J., Berg, Niel, Barton, Daniel L., Phillips, B. Scott MRS - Materials Research Society	8 国際会議録 Current transport and emission mechanisms in high-brightness green InGaN/AlGaN/GaN single quantum well light-emitting diodes Osinski,M., Perlin,P., Eliseev,P.G., Furioli,J. SPIE-The International Society for Optical Engineering
3 国際会議録 Life testing and failure analysis of GaN/AlGaN/InGaN light-emitting diodes Osinski,M., Barton,D.L., Helms,C.J., Berg,N.H., Perlin,P. SPIE-The International Society for Optical Engineering	9 国際会議録 Degradation of Single-Quantum-Well InGaN Green Light Emitting Diodes Under High Electrical Stress Osinski, Marek, Perlin, Piotr, Eliseev, Petr G., Liu, Gungtan, Barton, Daniel L. MRS - Materials Research Society
4 国際会議録 Life tests and failure mechanisms of GaN/AlGaN/InGaN light-emitting diodes Barton,D.L., Osiriski,M., Perlin,P., Helms,C.J., Berg,N.H. SPIE-The International Society for Optical Engineering	10 国際会議録 Role of Nanopipes in Degradation of AlGaN/InGaN/GaN Devices Operating at High Voltage Osinski, Marek, Lee, Jinhyun, Barton, Daniel L. MRS - Materials Research Society
5 国際会議録 Life tests and failure analysis of AIGaN/InGaN/GaN blue light-emitting diodes Barton,D.L., Osinski,M., Helms,C.J., Berg,N.H., Phillips,B.S. SPIE-The International Society for Optical Engineering	11 国際会議録 Analysis of impurity-related blue emission in Zn-doped GaN/InGaN/AIGaN double heterostructure Eliseev,P.G., Smagley,V.A., Perlin,P., Sartori,P., Osinski,M. SPIE-The International Society for Optical Engineering
6 国際会議録 Life Testing and Reliability Behavior of GaN/InGaN/AlGaN Light-Emitting Diodes Osinski, M., Barton, D. L., Helms, C. J., Berg, N. H., Seager, C. H. MRS - Materials Research Society	12 国際会議録 Optical and Electrical Characteristics of Single-Quantum-Well InGaN Light-Emitting Diodes Perlin, Piotr, Osinski, Marek, Eliseev, Petr G. MRS - Materials Research Society

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