Blank Cover Image

THE RELIABILITY OF MULTILEVEL METALLIZATION ON InGaAs/GaAs LAYERS

著者名:
掲載資料名:
Advanced metallization for devices and circuits--science, technology, and manufacturability : symposium held April 4-8, 1994, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
337
発行年:
1994
開始ページ:
387
出版情報:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992375 [1558992375]
言語:
英語
請求記号:
M23500/337
資料種別:
国際会議録

類似資料:

Wu, J. W., Chan, S. H., Lin, K. C., Chang, C. Y., Chang, E. Y.

MRS - Materials Research Society

Chuang, H.-M., Lin, K.-W., Yu, K.-H., Chen, C.-Y., Chen, J.-Y., Lai, P.-H, Kao, C.-I., Liu, W.-C.

Electrochemical Society

Yang,J.D., Lin,C.A., Yen,Y.T., Chen,S.F., Chang,C.H., Wu,J.S., Wu,J.R.

SPIE-The International Society for Optical Engineering

Matney, K. M., Eldredge, J. W., Goorsky, M. S.

MRS - Materials Research Society

Liu, W.C., Laih, L.W., Chen, J.Y., Wang, W.C., Lin, P.H.

Electrochemical Society

Wu, J. W., Chang, C. Y., Lin, K. C., Chang, E. Y., Hwang, J. H.

MRS - Materials Research Society

Li, G. P., Chou, Y. C., Chen, Y. C., Wu, C. S., Yu, K. K., Midford, T. A., Liu, Y., Sonek, G. J., Wei, X., Tromberg, B. …

MRS - Materials Research Society

T. S. Wu, W. C. Hsu, H. M. Shieh, C. L. Wu, W. Lin

Electrochemical Society

Liu, W.-C., Tsai, J.-H., Cheng, S.-Y., Wang, W.-C., Lin, P.-H., Chen, J.-Y.

Electrochemical Society

Su,Y.K., Chen,W.R., Chang,S.-J., Juang,F.-S., Lan,W.H., Lin,A.C.H., Chang,H.

SPIE - The International Society for Optical Engineering

Kim, Y-A., Kim, Y-I., Lee, K-W., Lee, S., Oh, K., Park, J-W., Sohn, S., Yang, S-H.

Materials Research Society

Kizilyalli,I.C., Abein,G., Chen,Z., Weber,G.R., Register,F., Harris,E., Chetlur,S., Higashi,G.S., Schofieled,M., Sen,S., …

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12