Influence of carbon contamination on ultrathin gate oxide reliability
- 著者名:
- Iwamoto,T. ( Tohoku Univ. )
- Miyake,T.
- Ohmi,T.
- 掲載資料名:
- Microelectronic Device and Multilevel Interconnection Technology II
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2875
- 発行年:
- 1996
- 開始ページ:
- 207
- 終了ページ:
- 215
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819422736 [0819422738]
- 言語:
- 英語
- 請求記号:
- P63600/2875
- 資料種別:
- 国際会議録
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