Analysis of interface and volume inhomogeneities in a multilayer system by light scattering methods
- 著者名:
- Pichlmaier,S. ( Friedrich-Schiller-Univ.Jena )
- Hehl,K.
- Schuhmann,U.
- Gliech,S.
- Duparre,A.
- 掲載資料名:
- Specification, Production, and Testing of Optical Components and Systems
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2775
- 発行年:
- 1996
- 巻:
- Part1
- 開始ページ:
- 287
- 終了ページ:
- 296
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819421609 [081942160X]
- 言語:
- 英語
- 請求記号:
- P63600/2775
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |