Blank Cover Image

Analysis of interface and volume inhomogeneities in a multilayer system by light scattering methods

著者名:
掲載資料名:
Specification, Production, and Testing of Optical Components and Systems
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2775
発行年:
1996
巻:
Part1
開始ページ:
287
終了ページ:
296
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819421609 [081942160X]
言語:
英語
請求記号:
P63600/2775
資料種別:
国際会議録

類似資料:

Gliech, S., Gessner, H., Duparre, A.

SPIE-The International Society for Optical Engineering

Schroder, S., Gliech, S., Duparre, A.

SPIE - The International Society of Optical Engineering

Duparre,A., Gliech,S.

SPIE-The International Society for Optical Engineering

Hultaker, A., Gliech, S., Benkert, N., Duparre, A.

SPIE - The International Society of Optical Engineering

Duparre,A., Gliech,S.

SPIE-The International Society for Optical Engineering

Gliech,S., Steinert,J., Flemming,M., Duparre,A.

SPIE-The International Society for Optical Engineering

Gliech,S., Duparre,A.

SPIE-The International Society for Optical Engineering

Bischoff,J., Hehl,K.

SPIE-The International Society for Optical Engineering

Schroder, S., Gliech, S., Duparre, A.

SPIE - The International Society of Optical Engineering

Schroeder, S., Kamprath, M., Gliech, S., Duparre, A.

SPIE - The International Society of Optical Engineering

Kupfer,H., Richter,F., Schlott,P., Duparre,A., Gliech,S.

SPIE - The International Society for Optical Engineering

Jakobs,S., Feigl,T., Duparre,A., Pichlmaier,S.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12