Blank Cover Image

Femtosecond Time-Resolved Photoelectron Spectroscopy of GaP(110),ZnTe(110),and ZnSe(110)

著者名:
掲載資料名:
Proceedings of the 13th International Conference on Defects in Insulating Materials, ICDIM 96, July 15-19, 1996, Wake Forest University, Winston-Salem, NC 27109, USA
シリーズ名:
Materials science forum
シリーズ巻号:
239-241
発行年:
1997
開始ページ:
159
終了ページ:
162
出版情報:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497560 [0878497560]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

類似資料:

Leblans,M., Thoma,R.K.R., LoPresti,J.L., Reichling,M., Williams,R.T.

SPIE-The International Society for Optical Engineering

Nguyen, T.A., Mackowski, S., Rho, H., Jackson, H.E., Smith, L.M., Wrobel, J., Fronc, K., Kossut, J., Karczewski, G., …

Materials Research Society

Thoma,E.D., Yochum,H.M., Binkley,M.J., Leblans,M., Williams,R.T.

Trans Tech Publications

Neison, A. J., Dunn, J., Widmann, K., ao, T., Ping, Y., Hunter, J. R., Ng, A.

SPIE - The International Society of Optical Engineering

M. C-K. Cheung, I. R. Sellers, I. L. Kuskovsky, A. N. Cartwright, B. D. McCombe

Society of Photo-optical Instrumentation Engineers

Aulombard, R. L., Briot, O., Briot, N., Cloitre, T., Gil, B., Sallese, J. M., Gailhanou, M., Bonard, J. M.

MRS - Materials Research Society

Lindner, R., Williams, R.T., Gtldde, J., Reichling, M.

Electrochemical Society

Zanni,M.T., Greenblatt,B.J., Davis,A.V., Neumark,D.M.

SPIE-The International Society for Optical Engineering

Ponga, B. E., Calas, J., Averous, M, Cloitte, T., Briot, O., Gil, B., Aulombard, R. L.

Materials Research Society

Lacha, L. M., Balda, R., Fernandez, J.R., Adam, J.L.

SPIE - The International Society of Optical Engineering

Zarychta, K., Nghiem, H. L., Cheikh, M., Tinet, E., Avrillier, S., Tualle, J.-M.

SPIE - The International Society of Optical Engineering

Matteson, J.L., Pelling, M.R., Skelton, R.T.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12