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Soft X-ray and EUV response of superconducting tunnel junctions: strong deviations from linearity

著者名:
Poelaert, A. ( European Space Agency, The Netherlands )
Kozorezov, A.
Peacock, A.
Wigmore, K.
Verhoeve, P.
Dordrecht, A. van
Owens, A.
Rando, N.
さらに 3 件
掲載資料名:
EUV, x-ray, and gamma-ray instrumentation for astronomy IX : 22-24 July 1998 San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3445
発行年:
1998
開始ページ:
214
終了ページ:
225
出版情報:
Bellingham, Wash.: SPIE
ISSN:
0277786X
ISBN:
9780819429001 [0819429007]
言語:
英語
請求記号:
P63600/3445
資料種別:
国際会議録

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