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TOD:a new method to characterize electro-optical system performance

著者名:
  • Bijl,P. ( TNO Human Factors Research Institute (Netherlands) )
  • Valeton,J.M. ( TNO Human Factors Research Institute (Netherlands) )
掲載資料名:
Infrared imaging systems : design, analysis, modeling, and testing IX : 15-16 April 1998, Orlando, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3377
発行年:
1998
開始ページ:
182
終了ページ:
193
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819428264 [0819428264]
言語:
英語
請求記号:
P63600/3377
資料種別:
国際会議録

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