High-performance 256｡ﾟ244 PtSi Schottky-Barrier IRCCD imager

著者名:

Yeh,R.-N. ( Chung Shan Institute of Science and Technology (Taiwan) )

Lin,I.-S. ( Chung Shan Institute of Science and Technology (Taiwan) )

Yeh,S.-H. ( Chung Shan Institute of Science and Technology (Taiwan) )

Liau,R.-H. ( Chung Shan Institute of Science and Technology (Taiwan) )

Wang,W.-S. ( Chung Shan Institute of Science and Technology (Taiwan) )

Chuang,T.-M. ( Chung Shan Institute of Science and Technology (Taiwan) )

Yen,W.-C. ( Chung Shan Institute of Science and Technology (Taiwan) )

Cherng,Y.-T. ( Chung Shan Institute of Science and Technology (Taiwan) )

Chang,H. ( Chung Shan Institute of Science and Technology (Taiwan) )

さらに 4 件

掲載資料名:

Infrared imaging systems : design, analysis, modeling, and testing IX : 15-16 April 1998, Orlando, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3377

発行年:

1998

開始ページ:

148

終了ページ:

154

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819428264 [0819428264]

言語:

英語

請求記号:

P63600/3377

資料種別:

国際会議録