Classification of product inspection items using nonlinear features

Classification of product inspection items using nonlinear features

著者名:

Talukder,A. ( Carnegie Mellon Univ. )
Casasent,D.P. ( Carnegie Mellon Univ. )
Lee,H.-W. ( Dongyang Univ.(Korea) )

掲載資料名:

Optical Pattern Recognition IX

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3386

発行年:

1998

開始ページ:

159

終了ページ:

170

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819428356 [0819428353]

言語:

英語

請求記号:

P63600/3386

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018773
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Optical Pattern Recognition
回次:	1998 : 9th
会議開催地:	Orlando, FL, USA
会議開催年:	1998.04.14-1998.04.15

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