Blank Cover Image

Reflection Electron Microscopy in TEM and STEM Instruments

著者名:
Cowley M. J.  
掲載資料名:
Reflection high-energy electron diffraction and reflection electron imaging of surfaces
シリーズ名:
NATO ASI series. Series B, Physics
シリーズ巻号:
188
発行年:
1988
開始ページ:
261
終了ページ:
284
総ページ数:
24
出版情報:
New York: Plenum Press
ISBN:
9780306430350 [0306430355]
言語:
英語
請求記号:
N11479/188
資料種別:
国際会議録

類似資料:

1 国際会議録 Reflection electron microscopy

Cowley M. J.

Plenum Press
7 国際会議録 Transmission Electron Microscopy (TEM) Studies of Ge Nanocrystals

Xu, Q., Sharp, I.D., Liao, C.Y., Yi, D.O., Ager III, J.W., Beeman, J.W., Liliental-Weber, Z., Yu, K.M., Zakharov, D., …

Materials Research Society
2 国際会議録 Reflection Electron Microscopy and Diffraction from Crystal Surfaces

Cowley, J. M.

North-Holland
8 国際会議録 *THE ORIGINS OF HIGH SPATIAL RESOLUTION SECONDARY ELECTRON MICROSCOPY

Scheinfein, M.R., Drucker, J.S., Liu, J., Weiss, J.K., Hembree, G.G., Cowley, J.M.

Materials Research Society
3 国際会議録 SURFACE CHARACTERIZATION BY REFLECTION ELECTRON MICROSCOPY (REM)

Hsu, Tung, Cowley, J. M

Materials Research Society
9 国際会議録 HIGH RESOLUTION STEM IMAGES AND NANODIFFRACTION PATTERNS ON HIGH Tc SUPERCONDUCTOR YBa2Cu3O7-x

Ou, H.-J., Higgs, A.A., Cowley, J.M.

Materials Research Society
4 国際会議録 Electron Microscopy and Diffraction Techniques for the Study of Small Particles

Cowley, J. M.

American Chemical Society
10 国際会議録 IN SITU TRANSMISSION ELECTRON MICROSCOPY (TEM) INVESTIGATION OF FRACTURE MECHANISMS IN A CALCIUM ALUMINATE MDF CEMENT

Popoola, O.O., Kriven, W.M., Young, J.F.

Materials Research Society
5 国際会議録 The Use of Scanning Transmission Electron Microscopes to Study Surfaces and Small Particles

Cowley, J. M.

American Chemical Society
11 国際会議録 Study of the Nanoscale Precipitation in 6056 Alloy (AlMgSi) by Conventional Transmission Electron Microscopy and TEM In-Situ Straining Experiments

Delmas, F., Casanove, M.J., Couret, A., Coujou, A.

Trans Tech Publications
6 国際会議録 Application of particle analysis to transmission electron microscopy (TEM)

J. DaPonte, T. Sadowski, C. C. Broadbridge, D. Day, A. H. Lehman, D. Krishna, L. Marinella, P. Munhutu, M. Sawicki

SPIE - The International Society of Optical Engineering
12 国際会議録 Dynamics of In Cluster Growth during InP(110) Surface Dissociation Studied by In-Situ Reflection Electron Microscopy

Gajdardziska-Josifovska, M., Malay, M. H., Smith, David J.

MRS - Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12