QE reduction due to pixel vignetting in CMOS image sensors

QE reduction due to pixel vignetting in CMOS image sensors

著者名:

Catrysse,P.B. ( Stanford Univ. )
Liu,X.
Gamal,A.El

掲載資料名:

Sensors and camera systems for scientific, industrial, and digital photography applications : 24-26 January 2000, San Jose, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3965

発行年:

2000

開始ページ:

420

終了ページ:

430

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819435835 [081943583X]

言語:

英語

請求記号:

P63600/3965

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018568
シリーズID:	PA00000029
会議名:	IS&T/SPIE Electronic Imaging : Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications
回次:	2000
会議開催地:	San Jose, CA, USA
会議開催年:	2000.01.24-2000.01.26

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