Predicting temperature increases on the GOES imager and sounder radiant coolers

Predicting temperature increases on the GOES imager and sounder radiant coolers

著者名:

掲載資料名:

Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3784

発行年:

1999

開始ページ:

24

終了ページ:

32

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819432704 [0819432709]

言語:

英語

請求記号:

P63600/3784

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018551
シリーズID:	PA00000029
会議名:	Optics & Photonics : Rough surface scattering and contamination
回次:	1999
会議開催地:	Denver, CO, USA
会議開催年:	1999.07.21-1999.07.23

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