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Theory and measurement of bidirectional reflectance for signature analysis

著者名:
掲載資料名:
Targets and backgrounds : characterization and representation V : 5-7 April 1999, Orlando, Florida
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3699
発行年:
1999
開始ページ:
2
終了ページ:
15
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819431738 [0819431737]
言語:
英語
請求記号:
P63600/3699
資料種別:
国際会議録

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