Blank Cover Image

New contamination engineering technology for active on-orbit surface cleaning

著者名:
掲載資料名:
Optical systems contamination and degradation II : effects, measurements, and control : 2-3 August 2000, San Diego, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4096
発行年:
2000
開始ページ:
101
終了ページ:
108
出版情報:
Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437419 [0819437417]
言語:
英語
請求記号:
P63600/4096
資料種別:
国際会議録

類似資料:

1 国際会議録 *CLEANING OF METAL CONTAMINATION

Mertens, P.W., Hurd, T.Q., Graf, D., Meuris, M., Schmidt, H.F., Heyns, M.M.

Electrochemical Society
7 国際会議録 Effect of Metal Contamination and Improved Cleaning Strategies

Mertens, P.W., Bearda, T., Lowewenstein, L.M., Martin, A.R., Hub, W., Kolbesen, B.O., Teerlink, I., Vos, R., Baeyens, …

Electrochemical Society
2 国際会議録 Spacecraft contamination, active cleaning and control

Stein, C., King, T.R., Wilson, W.G., Robertson, R.

SPIE
8 国際会議録 The New MMT

Blanco, D., Alegria, M., Callahan, S., Clark, D., Comisso, B., Foltz, C. B., Gibson, J. D., Heller, C., James, R., …

SPIE - The International Society of Optical Engineering
3 国際会議録 Corn as a Source of Antifungal Genes for Genetic Engineering of Crops for Resistance to Aflatoxin Contamination

Chen, Z.-Y., Cleveland, T.E., Brown, R.L., Bhatnagar, D., Cary, J.W., Rajasekaran, K.

American Chemical Society
9 国際会議録 PLASMA SURFACE INTERACTIONS AND SURFACE PRORERTIES FOR REMOTE H-PLASMA CLEANING OF Si(100)

Schneider, T. P., Cho, J., Chen, Y. L., Maher, D. M., Nemanich, R. J.

MRS - Materials Research Society
4 国際会議録 TRANSITION METAL CONTAMINATION OF EPITAXIAL SILICON

Scott, M. P., Caubin, L., Chen, D. C., Weber, E. R., Rose, J., Tucker, T.

Materials Research Society
10 国際会議録 Modal vibration control of an active surface telescope

Parziale,P.C., Smith,D.R.

SPIE-The International Society for Optical Engineering
5 国際会議録 A NEW CLEANING CONCEPT FOR PARTICLE AND METAL REMOVAL ON Si SURFACES

Meuris, M., Verhaverbeke, S., Mertens, P.W., Schmidt, H.F., Rotondaro, A.L.P., Heyns, M.M., Philipossian, A.

Electrochemical Society
11 国際会議録 Positron Lifetime on Clean Metallic Surfaces

Steindl,R., Kogel,G., Sperr,P., Willutzki,P., Britton,D.T., Triftshauser,W.

Trans Tech Publications
6 国際会議録 Effect of Cleaning on Metallic Contamination and Surface Roughness

Karn, P., Genis, A., Jacobs, C., Allen, L.P.

Electrochemical Society
12 国際会議録 Laser cleaning technology and its application

Song,W.D., Hong,M.H., Zhang,L., Lu,Y.F., Chong,T.C.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12