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Mir contamination observations and implications to the International Space Station

著者名:
掲載資料名:
Optical systems contamination and degradation II : effects, measurements, and control : 2-3 August 2000, San Diego, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4096
発行年:
2000
開始ページ:
55
終了ページ:
65
出版情報:
Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437419 [0819437417]
言語:
英語
請求記号:
P63600/4096
資料種別:
国際会議録

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