Blank Cover Image

Estimation of shallow-energy-level location in BaTiO3

著者名:
掲載資料名:
Optoelectronic Materials and Devices II
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4078
発行年:
2000
開始ページ:
786
終了ページ:
792
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437174 [0819437174]
言語:
英語
請求記号:
P63600/4078
資料種別:
国際会議録

類似資料:

1 国際会議録 Effects of annealing atmosphere on photorefractive BaTiO3

Chang,J.-Y., Huang,C.-Y., Sun,C.-C.

SPIE-The International Society for Optical Engineering
7 国際会議録 The Magneto-Transport Properties of Sandwich Films of Permalloy/Cu/Co

Lo, C. K., Ho, C. H., Klik, I., Yao, Y. D., Lee, S. F., Huang, H. H., Chen, Y. C., Wu, C. Y., Chiang, D. Y., Chang, C. …

MRS - Materials Research Society
2 国際会議録 Nanoscale-level dielectric property image of low-k dielectric materials for copper metallization using energy-filtered TEM

Lo,S.-C., Chen,F.-R., Kai,J.-J., Chen,L.-C., Chang,L., Chiang,C.-C., Ding,P., Chin,B., Chen,F.E.

SPIE-The International Society for Optical Engineering
8 国際会議録 Shallow and deep impurity levels in undoped Rh-and Ce-doped photorefractive BaTiO3 (Invited Paper)

Dou,S.X., Song,H., Chi,M., Zhu,Y., Ye,P.

SPIE-The International Society for Optical Engineering
3 国際会議録 Optics education for now and future from an entropy perspective

S.C. Donn

Society of Photo-optical Instrumentation Engineers
9 国際会議録 Experimental Study for a New Energy Dissipation Device: Multiple-Direction Damper

C. S. Tsai, L. L. Chung, T. C. Chiang, B. J. Chen, W. S. Chen

American Society of Mechanical Engineers
4 国際会議録 Precise measurement of the amplitude of photorefractive index gratings

Sun,C.-C., Tu,C.C., Chen,M.C., Chung,P.T., Donn,S.C.

SPIE - The International Society for Optical Engineering
10 国際会議録 Computation of brain neurodegeneration in the Alzheimer’s fly [6143-123]

Lee P C, Huang, Y. R., Chang, H. M., Chiang, A. S., Ching, Y. T.

SPIE - The International Society of Optical Engineering
5 国際会議録 Photorefractive properties of reduced BaTiO3:Rh at wavelengths of 514 nm and 633 nm

Chang, J.Y., Huang, C.Y., Duan, S.H., Sun, C.C.

SPIE
11 国際会議録 Effect of Process Pressure on Atomic Layer Deposition of Al2O3

M. Li, Y. Chang, H. Wu, C. Huang, J. Chen

Electrochemical Society
6 国際会議録 Robust Estimation Design of a Class of Systems with Noise Coupling Input Saturation

Y.Y. Chen, S.J. Chang, S.C. Shen, Y.H. Chen

Trans Tech Publications
12 国際会議録 Patterning fidelity on low-energy multiple-electron-beam direct write lithography

S. M. Chang, S. J. Lin, C. A. Lin, J. H. Chen, T. S. Gau

Society of Photo-optical Instrumentation Engineers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12