Stress distributions in patterned-substrate InCaAs/InP

Stress distributions in patterned-substrate InCaAs/InP

著者名:

Lefebvre,J. ( National Research Council Canada )
Aers,G.C.
Poole,P.J.
Williams,R.L.

掲載資料名:

Optoelectronic Materials and Devices II

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4078

発行年:

2000

開始ページ:

659

終了ページ:

663

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819437174 [0819437174]

言語:

英語

請求記号:

P63600/4078

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018522
シリーズID:	PA00000029
会議名:	Photonics Taiwan : Optoelectroflic Materials and Devices
回次:	2000 : 2nd
会議開催地:	Taipei, Taiwan
会議開催年:	2000.07.26-2000.07.28

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