Gallium K-edge EXAFS study of GaN:Mg films
- 著者名:
Pan,Y.-C. ( National Chiao Tung Univ. ) Wang,S.-F. Lee,W.-H. Lin,W.-C. Shu,C.-K. Chiang,C.-I. Lin,C.-W. Chang,H. Lee,J.-F. Jang,L.-Y. Lin,D.-S. Lee,M.-C. Chen,W.-H. Chen,W.-K. - 掲載資料名:
- Optoelectronic Materials and Devices II
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4078
- 発行年:
- 2000
- 開始ページ:
- 535
- 終了ページ:
- 543
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819437174 [0819437174]
- 言語:
- 英語
- 請求記号:
- P63600/4078
- 資料種別:
- 国際会議録
類似資料:
Materials Research Society |
Electrochemical Society |
Materials Research Society |
Kluwer |
SPIE - The International Society for Optical Engineering |
MRS - Materials Research Society |
Trans Tech Publications |
10
国際会議録
Non-Equilibrium Acceptor Concentration In GaN:Mg Grown by Metalorganic Chemical Vapor Deposition
Materials Research Society |
MRS - Materials Research Society |
Trans Tech Publications |
MRS - Materials Research Society |
Materials Research Society |