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Novel instruments for site characterization

著者名:
掲載資料名:
Optical and IR telescope instrumentation and detectors : 27-31 March 2000, Munich, Germany
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4008
発行年:
2000
巻:
Part2
開始ページ:
1376
終了ページ:
1382
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436337 [081943633X]
言語:
英語
請求記号:
P63600/4008
資料種別:
国際会議録

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