Soled, S., Murrell, L. L., Wachs, I. E., McVicker, G. B., Sherman, L. G., Chan, S., Dispenziere, N. C., Baker, R. T. K.
American Chemical Society
|
Park, J. C., Lee, J.H., Kim, P., yi, J.
Elsevier
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Murrell, L. L., Dispenziere, N. C., Jr., Baker, R. T. K., Chludzinski, J. J.
American Chemical Society
|
Jeong Kuk Shon, Miran Seo, Jin-Hoe Kim, Hyung Ik Lee, Chang Hyun Ko
American Institute of Chemical Engineers
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Bellussi, G., Perego, C., Carati, A., Peratello, S., Massara, E. Previde, Perego, G.
Elsevier
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Emmanuel de la Rochefoucauld, Xavier Carrier, Jean-Marc Krafft, Juliette Blanchard
Elsevier
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Ting, -C. Y., Shy, -L. S.
SPIE - The International Society of Optical Engineering
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Atsushi Ishihara, Kohei Nakajima, Motoki Hirado, Tadanori Hashimoto, Hiroyuki Nasu
American Chemical Society
|
Hata, N., Negoro, C., Takada, S., Yamada, K., Oku, Y., Kikkawa, T.
Materials Research Society
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Kim, Y., Kim, C., Choi, J. W., Kim, P., Yi, J.
Elsevier
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Murrell, L. L., Tauster, S. J.
Elsevier
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Ghosh, S., Makhija, S., Santra, M., Krishnan, V., K, Mohan Prabhu, Murthy, V. L. N., Rao, M. Rama, Ray, S. K.
Elsevier
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