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Ellipsometry Studies, Optical Properties, and Band Structure of Ge1-yCy, Ge-Rich Si1-x-yGexCy, and Boron-Doped Si1-xGex Alloys

著者名:
Junge, Kelly E.
Lange, Rudiger
Dolan, Jennifer M.
Zollner, Stefan
Humlicek, Josef
Dashiell, M. W.
Hits, D. A.
Orner, B. A.
Kolodzey, James
さらに 4 件
掲載資料名:
Epitaxy and applications of si-based heterostructures : symposium held April 13-17, 1998, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
533
発行年:
1998
開始ページ:
125
出版情報:
Warrendale, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994393 [1558994394]
言語:
英語
請求記号:
M23500/533
資料種別:
国際会議録

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