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Application of Dielectric Analysis to the Study of Aging in Adhesive Bonded Structures

著者名:
Pethrick, Richard A.
Joshi, Sadanand B.
Hayward, David
Li, Zhi-Cheng
Halliday, Steven
Banks, William M.
Gilmore, Ray
Yates, Lawrence W.
さらに 3 件
掲載資料名:
Nondestructive characterization of materials in aging systems : symposium held November 30-December 4, 1997, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
503
発行年:
1998
開始ページ:
69
出版情報:
Warrendale, Penn.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994089 [1558994084]
言語:
英語
請求記号:
M23500/503
資料種別:
国際会議録

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