Blank Cover Image

X-ray Diffraction Analysis of the Strain of SiGeC/(100)Si Alloys

著者名:
掲載資料名:
Evolution of epitaxial structure and morphology : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
399
発行年:
1996
開始ページ:
461
出版情報:
Pittsburgh, Pennsylvania: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993020 [1558993029]
言語:
英語
請求記号:
M23500/399
資料種別:
国際会議録

類似資料:

1 国際会議録 STRAIN MEASUREMENTS OF SiGeC HETEROEPITAXIAL LAYERS ON Si(100) USING ION BEAM ANALYSIS

Sego, S., Culbertson, R. J., Ye, P., Hearne, S., Xiang, J., Herbots, N., Atzmon, Z., Bair, A. E.

MRS - Materials Research Society
7 国際会議録 Analysis of Residual Stress in Polycrystalline Silver Thin Films by X-ray Diffraction

Alford, T. L., Zeng, Yuxiao, Zou, Y. L., Deng, F., Lau, S. S., Laursen, T., Ullrich, B. Manfred

MRS - Materials Research Society
2 国際会議録 Cobalt and Titanium Metallization of SiGeC for Shallow Contacts

Bair, A. E., Alford, T. L., Atzmon, Z., Marcus, S. D., Doller, D. C., Morton, R., Lau, S. S., Mayer, J. W.

MRS - Materials Research Society
8 国際会議録 METASTABLE SiC AND SiGeC ALLOYS BY CARBON IMPLANTATION AND SOLID PHASE EPITAXY

Strane, J.W., Edwards, W.J., Mayer, J.W., Stein, H.S., Lee, S.R., Doyle, B.L., Picraux, S.T.

Materials Research Society
3 国際会議録 Wet Oxidation of Si1-x-yGexCy Layers on (100) Si

Bair, A. E., Atzmon, Z., Alford, T. L., Chandrasekhar, D., Smith, David J.

MRS - Materials Research Society
9 国際会議録 Synchrotron Energy-Dispersive X-Ray Diffraction Analysis of Residual Strains around Friction Welds between Dissimilar Aluminium and Nickel Alloys

T.S. Jun, S.Y. Zhang, M. Golshan, M.J. Peel, D.G. Richards

Trans Tech Publications
4 国際会議録 INVESTIGATION OF CHROMIUM NITRIDATION USING ION BEAM RESONANCE ANALYSIS

Russell, S. W., Bair, A. E., Rack, M. J., Adams, D., Spreitzer, R. L., Alford, T. L., Culbertson, R. J.

MRS - Materials Research Society
10 国際会議録 Tetragonal strain in MBE GexSi1-x films grown on (100) Si observed by ion channeling and x-ray diffraction

Fiory, A. T., Feldman, L. C., Bean, J. C., Robison, I. K.

North-Holland
5 国際会議録 INTERFACIAL REACTIONS OF COPPER / REFRACTORY ALLOY AND BILAYER FILMS ON SiO2

Spreitzer, R. L., Rafalski, S. A., Adams, D., Russell, S. W., Atzmon, Z., Li, J., Alford, T. L., Mayer, J. W.

MRS - Materials Research Society
11 国際会議録 OPTOELECTRONIC PROPERTIES OF AMORPHOUS SiGeC ALLOYS

Kolodzey, J., Schwarz, R., Wang, F., Muschik, T., Krajewski, J., Shekhar, R., Barteau, M., Plattner, R., Gunzel, E.

Materials Research Society
6 国際会議録 Heteroepitaxial Si1-x-yGexCy Layer Growth on (100)Si by Atmospheric Pressure Chemical Vapor Deposition

Atzmon, Z., Bair, A. E., A'ford, T. L., Chandrasekhar, D., Smith, David J., Mayer, J. W.

MRS - Materials Research Society
12 国際会議録 In Situ Investigation of Working Battery Electrodes Using Synchrotron X-ray Diffraction

Jisrawi, N. W., Thurston, T. R., Yang, X. Q., Mukerjee, S., McBreen, J., Daroux, M. L., Xing, X. K.

MRS - Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12