Surfactant-Mediated Growth of SiGe/Si Quantum-Well Structures Studied by Photoluminescence Technique and Secondary Ion Mass Spectrometry

Surfactant-Mediated Growth of SiGe/Si Quantum-Well Structures Studied by Photoluminescence Technique and Secondary Ion Mass Spectrometry

著者名:

掲載資料名:

Evolution of epitaxial structure and morphology : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

399

発行年:

1996

開始ページ:

197

出版情報:

Pittsburgh, Pennsylvania: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558993020 [1558993029]

言語:

英語

請求記号:

M23500/399

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018446
シリーズID:	PA00000011
会議名:	Symposium on evolution of epitaxial structure and morphology
回次:	1995
会議開催地:	Boston, MA, USA
会議開催年:	1995.11.27-1995.12.01

類似資料:

1 国際会議録 Photoluminescence Characterization of SiGe/Si Quantum-Well Wire Structures Nilsson, S., Zeindl, H. P., Wolff, A., Pressel, K. MRS - Materials Research Society	7 国際会議録 Molecular Secondary Ion Mass Spectrometry Pachuta, Steven J., Cooks, R. Graham American Chemical Society
2 国際会議録 Correlation Between Photoluminescence Spectral Features and Crystal Growth Temperature for SiGe Single Quantum Wells Gerling, M., Nilsson, S., Zeindl, H. P., Jagdhold, U. MRS - Materials Research Society	8 国際会議録 Photoluminescence of Strain-Engineered MBE-Grown GaN and InGaN Quantum-Well Structures Kruger, Joachim., Kisielowski, Christian, Klockenbrink, Ralf, Sudhir, G. S., Kim, Yihwan, Rubin, Michael, Weber, Eicke … MRS - Materials Research Society
3 国際会議録 *SiGe/Si QUANTUM WELLS BY MBE: A PHOTOLUMINESCENCE STUDY Houghton, D.C., Rowell, N.L., Noel, J.-P., Aers, G., Davies, M., Wang, A., Perovic, D.D. Materials Research Society	9 国際会議録 Secondary Ion Mass Spectrometry: A Multidimensional Technique Colton, Richard J., Kidwell, David A., Ramseyer, George O., Ross, Mark M. American Chemical Society
4 国際会議録 A HIGH DEPTH RESOLUTION BACKSIDE SECONDARY ION MASS SPECTROMETRY TECHNIQUE USED FOR STUDYING METAL/GaAs CONTACTS Palmstrom, C.J., Schwarz, S.A., Marshall, E.D., Yablonovitch, E., Harbison, J.P., Schwartz, C.L., Florez, L., Gmitter, … Materials Research Society	10 国際会議録 PHOTOLUMINESCENCE OF SiGe ALLOYS IMPLANTED WITH ERBIUM Erzgraber, H. B., Gaworzewski, P., Schmalz, K., Kruger, D., Morgenstern, T., Osinsky, A., Vatnik, M. MRS - Materials Research Society
5 国際会議録 Advances in Characterization of III-Nitrides by Secondary Ion Mass Spectrometry Lierde, P. V., Tian, C., Hockett, R.A., Wei, L., Hockett, D.S., Alejandro, P.C., Keller, S., DenBaars, S.P. Electrochemical Society	11 国際会議録 INTERFACE ROUCHNESS OF QUANTUM WELLS STUDIED BY TIME-RESOLVED PHOTOLUMINESCENCE Jiang, H. X., Zhou P., Solin, S. A., Bai, G. Materials Research Society
6 国際会議録 Characterization of TiAl Alloys by Secondary Ion Mass Spectrometry Barbosa, J., Teodoro, O.M.N.D., Moutinho, A.M.C., Ribeiro, S., Monteiro, C. Trans Tech Publications	12 国際会議録 Measurements of the Diffusion of Iron and Carbon in Single-Crystal NiAl Using Ion Implantation and Secondary Ion Mass Spectrometry Hanrahan, R. J., Jr., Withrow, S. P., Puga-Lambers, M. MRS - Materials Research Society

1

2

3

4

5

6

7

8

9

10

11

12