Application of near-infrared TDLAS systems to HF measurements in aluminum smelters

Application of near-infrared TDLAS systems to HF measurements in aluminum smelters

著者名:

Schiff,H.I. ( Unisearch Associates Inc. )
Nadler,S.D.
Pisano,J.T.
Mackay,G.I.

掲載資料名:

Application of tunable diode and other infrared sources for atmospheric studies and industrial process monitoring : 8-9 August 1996, Denver, Colorado

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2834

発行年:

1996

開始ページ:

198

終了ページ:

204

出版情報:

Bellingham, WA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819422224 [0819422223]

言語:

英語

請求記号:

P63600/2834

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018418
シリーズID:	PA00000029
会議名:	Optics & Photonics : International Symposium on Optical Science, Engineering, and Instrumentation
回次:	1996
会議開催地:	Denver, CO, USA
会議開催年:	1996.08.08-1996.08.09

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