Analysis of VCSEL degradation modes
- 著者名:
Herrick,R.W. ( Univ.of California/Santa Barbara ) Cheng,Y.M. Beck,J.M. Petroff,P.M. Scott,J.W. Peters,M.G. Robinson,G.D. Coldren,L.A. Morgan,R.A. Hibbs-Brenner,M.K. - 掲載資料名:
- Fabrication, testing, and reliability of semiconductor lasers : 31 January-1 February, 1996, San Jose, California
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2683
- 発行年:
- 1996
- 開始ページ:
- 123
- 終了ページ:
- 133
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819420572 [0819420573]
- 言語:
- 英語
- 請求記号:
- P63600/2683
- 資料種別:
- 国際会議録
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