Thermal Evolution of Defect Profiles in H-Implanted Silicon Studied by Slow Positrons
- 著者名:
Brusa,R.S. Naia,M.Duarte Dupasquier,A. Ottaviani,G. Tonini,R. Zecca,A. - 掲載資料名:
- Positron annihilation : Proceedings of the 9th International Conference on Positron Annihilation, August 26-31, 1991, Szombathely, Hungary
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 105-110
- 発行年:
- 1992
- 巻:
- Pt.3
- 開始ページ:
- 1367
- 終了ページ:
- 1370
- 出版情報:
- Aederlmannsdorf, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878496365 [087849636x]
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
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Influence of Mn and Fe on Defects in NiAl Alloy Investigated by Positron Annihilation Techniques
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