Real-time infrared test set: system design and development

著者名:

Johnson,R.B. ( Optical E.T.C.,Inc. )

Martin,D.H. ( Optical E.T.C.,Inc. )

Chung,R. ( Optical E.T.C.,Inc. )

Geist,J.C. ( Optical E.T.C.,Inc. )

Burrell,J.O. ( Optical E.T.C.,Inc. )

Slemp,J.L. ( Optical E.T.C.,Inc. )

Umstead,J.R. ( Optical E.T.C.,Inc. )

Mann,A. ( Optical E.T.C.,Inc. )

Marlin,H.R. ( Naval Command,Control and Ocean Surveillance Ctr. )

Bates,R.L. ( Naval Command,Control and Ocean Surveillance Ctr. )

Sweet,M.H. ( Naval Command,Control and Ocean Surveillance Ctr. )

Williams,D.N. ( Naval Command,Control and Ocean Surveillance Ctr. )

Carlson,R.M. ( Naval Command,Control and Ocean Surveillance Ctr. )

Gaitan,M. ( National Institute of Standards and Technology )

Marshall,J.C. ( National Institute of Standards and Technology )

Mulford,C.D. ( U.S. Army Research Lab. )

Zakar,E.S. ( U.S. Army Research Lab. )

Zeto,R.J. ( U.S. Army Research Lab. )

Olson,R. ( The Titan Corp. )

Perkins,G.C. ( The Titan Corp. )

さらに 15 件

掲載資料名:

Technologies for synthetic environments : hardware-in-the-loop testing II : 21-23 April 1997, Orlando, Florida

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3084

発行年:

1997

開始ページ:

78

終了ページ:

90

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819424990 [0819424994]

言語:

英語

請求記号:

P63600/3084

資料種別:

国際会議録