Calibration of the AXAF observatory: overview

Calibration of the AXAF observatory: overview

著者名:

Weisskopf,M.C. ( NASA Marshall Space Flight Ctr. )
O'Dell,S.L. ( NASA Marshall Space Flight Ctr. )

掲載資料名:

Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3113

発行年:

1997

開始ページ:

2

終了ページ:

17

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819425355 [0819425354]

言語:

英語

請求記号:

P63600/3113

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018337
シリーズID:	PA00000029
会議名:	Optics & Photonics : Grazing Incidence and Multilayer X-Ray Optical Systems
回次:	1997
会議開催地:	San Diego, CA, USA
会議開催年:	1997.07.27-1997.07.29

類似資料:

1 国際会議録 Advanced X-ray Astrophysics Facility (AXAF): calibration overview O'Dell, S.L., Weisskopf, M.C. SPIE	7 国際会議録 Calibration results for the AXAF flight contamination monitor Elsner, R.F., O'Dell, S.L., Ramsey, B.D., Tennant, A.F., Weisskopf, M.C., Kolodziejczak, J.J., Swartz, D.A., Engelhaupt, … SPIE
2 国際会議録 Advanced X-ray Astrophysics Facility (AXAF): an overview M.C. Weisskopf, S.L. O'Dell, R.F. Elsner, L.P. Van Speybroeck Society of Photo-optical Instrumentation Engineers	8 国際会議録 The role of project science in the Chandra X-ray Observatory [6271-07] O’Dell S. L, Weisskopf M. C SPIE - The International Society of Optical Engineering
3 国際会議録 On the use of monochromators during AXAF calibration Swartz, D.A., Elsner, R.F., Kolodziejczak, J.J., O'Dell, S.L., Tennant, A.F., Sulkanen, M.E., Weisskopf, M.C., Edgar, … SPIE	9 国際会議録 Absolute calibration of the AXAF telescope effective area Kellogg,E.M., Cohen,L.M., Edgar,R.J., Evans,I.N., Freeman,M.D., Gaetz,T.J., Jerius,D., McDermott,W.C., McKinnon,P.J., … SPIE-The International Society for Optical Engineering
4 国際会議録 Chandra X-ray Observatory(CXO):overview Weisskopf,M.C., Tananbaum,H.D., Speybroeck,L.P.Van, O'Dell,S.L. SPIE - The International Society for Optical Engineering	10 国際会議録 Measurements with the Chandra X-Ray Observatory's flight contamination monitor Elsner,R.F., Kolodziejczak,J.J., O'Dell,S.L., Swartz,D.A., Tennant,A.F., Weisskopf,M.C. SPIE-The International Society for Optical Engineering
5 国際会議録 Advanced X-Ray Astrophysics Facility(AXAF) Weisskopf,M.C., O'Dell,S.L., Speybroeck,L.P.Van SPIE-The International Society for Optical Engineering	11 国際会議録 Measurements with the Chandra X-ray Observatory's flight contamination monitor Elsner,R.F., Kolodziejczak,J.J., O'Dell,S.L., Swartz,D.A., Tennant,A.F., Weisskopf,M.C. SPIE - The International Society for Optical Engineering
6 国際会議録 Uses of continuum radiation in the AXAF calibration Kolodziejczak,J.J., Austin,R.A., Elsner,R.F., O'Dell,S.L., Sulkanen,M.E., Swartz,D.A., Tennant,A.F., Weisskopf,M.C., … SPIE-The International Society for Optical Engineering	12 国際会議録 AXAF HXDS germanium solid state detectors McDermott,W.C., Kellogg,E.M., Wargelin,B.J., Evans,I.N., Vitek,S.A., Tsiang,E.Y., Schwartz,D.A., Edgar,R.J., Kraft,S., … SPIE-The International Society for Optical Engineering

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