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Advantages of SOI technology in low-voltage ULSIs (Invited Paper)

著者名:
Yoshimi,M. ( Toshiba Corp. (Japan) )
Kawanaka,S. ( Toshiba Corp. (Japan) )
Yamada,T. ( Toshiba Corp. (Japan) )
Terauchi,M. ( Toshiba Corp. (Japan) )
Shino,T. ( Toshiba Corp. (Japan) )
Fuse,T. ( Toshiba Corp. (Japan) )
Oowaki,Y. ( Toshiba Corp. (Japan) )
Watanabe,S. ( Toshiba Corp. (Japan) )
さらに 3 件
掲載資料名:
Microelectronic Device Technology : 1-2 October 1997, Austin, Texas
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3212
発行年:
1997
開始ページ:
178
終了ページ:
187
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819426444 [081942644X]
言語:
英語
請求記号:
P63600/3212
資料種別:
国際会議録

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