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New method of measuring CCD device photoresponse nonuniformity

著者名:
Wang,F. ( Ordnance Engineering College (China) )
Shen,X. ( Ordnance Engineering College (China) )
Chen,W. ( Ordnance Engineering College (China) )
Sun,X. ( Ordnance Engineering College (China) )
Dong,W. ( Ordnance Engineering College (China) )
Zhou,B. ( Ordnance Engineering College (China) )
さらに 1 件
掲載資料名:
Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3553
発行年:
1998
開始ページ:
295
終了ページ:
296
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430144 [0819430145]
言語:
英語
請求記号:
P63600/3553
資料種別:
国際会議録

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