Analysis and simulation of the low-temperature performance of Si/SiGe HBTs for the integrated infrared receiver
- 著者名:
Zhao,L. ( Beijing Polytechnic Univ.(China) ) Xu,C. ( Beijing Polytechnic Univ.(China) ) Gao,G. ( Beijing Polytechnic Univ.(China) ) Zou,D. ( Beijing Polytechnic Univ.(China) ) Chen,J. ( Beijing Polytechnic Univ.(China) ) Shen,G. ( Beijing Polytechnic Univ.(China) ) Ni,W.X. ( Hansson,Linkoping Univ.(Sweden) ) Hansson,G.V. ( Hansson,Linkoping Univ.(Sweden) ) - 掲載資料名:
- Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3553
- 発行年:
- 1998
- 開始ページ:
- 112
- 終了ページ:
- 119
- 出版情報:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819430144 [0819430145]
- 言語:
- 英語
- 請求記号:
- P63600/3553
- 資料種別:
- 国際会議録
類似資料:
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2
国際会議録
Effects of the relative positions between pn junction interface and SiGe-Si interface in SiGe/Si HBT
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Trans Tech Publications |
SPIE-The International Society for Optical Engineering |
Trans Tech Publications |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering | |
Trans Tech Publications |
Kluwer Academic Publishers |