Silicon formation at Fe-Si interfaces studied by Mossbauer spectroscopy and Rutherford backscattering
- 著者名:
- Cohen, R.L. ( Bell Laboratories )
- Feldman, L.C. ( Bell Laboratories )
- West, K.W. ( Bell Laboratories )
- Silverman, P.J. ( Bell Laboratories )
- 掲載資料名:
- Nuclear and electron resonance spectroscopies applied to materials science : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposia proceedings
- シリーズ巻号:
- 3
- 発行年:
- 1981
- 開始ページ:
- 357
- 終了ページ:
- 358
- 出版情報:
- New York, N.Y.: North Holland
- ISSN:
- 02729172
- ISBN:
- 9780444005977 [0444005978]
- 言語:
- 英語
- 請求記号:
- M23500/3
- 資料種別:
- 国際会議録
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