Minimize Part Warpage by Integrated CAE Technology
- 著者名:
- Chang -Y. R. ( National Tsing-Hua University )
- Chen -C. Y. ( National Tsing-Hua University )
- Hsu -H. C. ( CoreTech System Co., Ltd. )
- Tsai -H. M.
- 掲載資料名:
- Conference proceedings at ANTEC '98 : plastics on my mind, Society of Plastics Engineers, Atlanta, Georgia, April 26-April 30, 1998
- シリーズ名:
- Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
- シリーズ巻号:
- 44(1)
- 発行年:
- 1998
- 巻:
- 1
- 開始ページ:
- 903
- 終了ページ:
- 907
- 総ページ数:
- 5
- 出版情報:
- Brookfield Center, CT: Society of Plastics Engineers, Inc. (SPE)
- ISBN:
- 9781566766692 [1566766699]
- 言語:
- 英語
- 請求記号:
- S42700/44-1
- 資料種別:
- 国際会議録
類似資料:
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10
国際会議録
Evaluation, reduction, and monitoring of progressive defects on 193-nm reticles for low-k1 process
SPIE - The International Society of Optical Engineering |
Society of Plastics Engineers |
SPIE - The International Society of Optical Engineering |
Society of Plastics Engineers, Inc. (SPE) |
SPIE - The International Society of Optical Engineering |