Blank Cover Image

Determination of Out-of-Plane Expansion in Thin Polymers Films

著者名:
掲載資料名:
ANTEC 93 : Be in that number : conference proceedings : New Orleans, May 9-13, 1993
シリーズ名:
Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
シリーズ巻号:
39
発行年:
1993
巻:
1
開始ページ:
1925
終了ページ:
1927
総ページ数:
3
出版情報:
Brookfield Center, CT: Society of Plastics Engineers, Inc. (SPE)
言語:
英語
請求記号:
S42700/932082
資料種別:
国際会議録

類似資料:

1 国際会議録 Out-of-Plane Expansion Measurements in Polyimide Films

Pottiger, Michael T., Coburn, John C.

American Chemical Society
7 国際会議録 MODELING STRESSES IN POLYIMIDE FILMS

Pottiger, Michael T., Coburn, John C.

MRS - Materials Research Society
2 国際会議録 A Pressure-Volume-Temperature Investigation of Out-of-Plane Properties of Thin Polymer Films

Chen J. M., Sheth C. K., Farris J. R.

Society of Plastics Engineers, Inc. (SPE)
8 国際会議録 Galvanomagnetic Effects in Ni81Fe19 Thin Films under In-Plane and Out-of-Plane Magnetic Field

Santos, J.A.M., Kakazei, G.N., Pereira, A.M., Pogorelov, Yu.G., Carpinteiro, F.S., Sousa, J.B.

Trans Tech Publications
3 国際会議録 The Relationship of Morphology to Properties in Spin Coated Polyimide Films

Coburn C. J., Pottiger T. M.

Society of Plastics Engineers, Inc. (SPE)
9 国際会議録 DETERMINATION OF LINEAR AND NONLINEAR OPTICAL PROPERTIES OF A POLYMER THIN FILM

Klein Koerkamp, H.M.M., Hoekstra, T.H., Driessen, A., Pompa, Th.J.A, Mohlmann, G.R., Horsthuis, WH..G., Erdhuisen, …

Materials Research Society
4 国際会議録 INTERNAL STRESS DEVELOPMENT IN SPIN COATED POLYIMIDE FILMS

Pottiger, M. T., Coburn, J.

Materials Research Society
10 国際会議録 JcS in HTS Thick Films: Influence of Out-of-plane Misorientation

J. Z. Wu, R. Emergo, X. Wang, D. Christen, T. Aytug, M. Paranthaman

Electrochemical Society
5 国際会議録 Effect of in-plane and out-of-plane misorientation on the ferroelectric properties of thin film ferroelectric PZT infrared sensors on Si substrates

Vallejo, R.N., Yun, S.-H., Wu, J.Z., Tidrow, M.Z., Braaten, H., Hansen, C., Adrent, P.

SPIE-The International Society for Optical Engineering
11 国際会議録 Determination of optical properties of PLZT thin films using transmittance spectra processing

Pencheva, T.G., Nenkov, M., Jelinek, M., Lancok, J., Bulir, J., Deineka, A., Xu, C.-N.

SPIE-The International Society for Optical Engineering
6 国際会議録 X-RAY DIFFRACTION DETERMINATION OF STRESSES IN THIN FILMS

Vreeland, Jr. T., Dommann, A., Tsai, C.-J., Nicolet, M.-A.

Materials Research Society
12 国際会議録 Out-of-plane microstructures using stress engineering of thin films

Tsai,C.-L., Henning,A.K.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12