Blank Cover Image

Friction Force Microscopy at Ultrasonic Frequencies

著者名:
掲載資料名:
Micro/nanotribology and its applications
シリーズ名:
NATO ASI series. Series E, Applied sciences
シリーズ巻号:
330
発行年:
1997
開始ページ:
225
終了ページ:
231
総ページ数:
7
出版情報:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792343868 [0792343867]
言語:
英語
請求記号:
N11482/330
資料種別:
国際会議録

類似資料:

1 国際会議録 Atomic force microscopy at ultrasonic frequencies (Invited Paper)

Arnold, W., Hirsekorn, S., Kopycinska, M., Rabe, U., Reinstaedtler, M., Scherer, V.

SPIE-The International Society for Optical Engineering
7 国際会議録 Friction in Low-Load Regime: Studies on the Pressure and Direction Dependence of Frictional Forces by Means of Friction Force Microscopy

Schwarz D. U., Bluhm H., Holscher H., Allers W., Wiesendanger R.

Kluwer Academic Publishers
2 国際会議録 *Quantitative contact spectroscopy and imaging by atomic-force acoustic microscopy

Arnold, W., Amelio, S., Hirsekorn, S., Rabe, U.

MRS-Materials Research Society
8 国際会議録 Ultrasonic atomic force microscopy with real-time mapping of resonance frequency and Q factor (Invited Paper)

Yamanaka, K., Irihama, H., Tsuji, T., Nakamoto, K.

SPIE-The International Society for Optical Engineering
3 国際会議録 Friction Force Microscopy

Meyer E., Luthi R., Howald L., Guntherodt -J. H.

Kluwer Academic Publishers
9 国際会議録 Sliding Friction by Atomic Force Microscopy

Pasquier, V., Drake, J. M.

MRS - Materials Research Society
4 国際会議録 Micromachined probes for high-frequency scanning force microscopy and scanning thermal microscopy

Stopka,M., Munster,S., Leinhos,T., Mihalcea,Ch., Scholz,W., Leyk,A., Mertin,W., Oesterschulze,E.

SPIE-The International Society for Optical Engineering
10 国際会議録 Ultrasonic behavior of superconducting amorphous metal PdZr at low temperatures

Weiss G., Arnold W.

Sijthoff & Noordhoff International Publishers
5 国際会議録 Instrumentation for Scanning Force Microscopy and Friction Force Microscopy

Marti O.

Kluwer Academic Publishers
11 国際会議録 Improving atomic force microscopy images with the adaptation of ultrasonic force microscopy

Druffner, C.J., Sathish, S.

SPIE-The International Society for Optical Engineering
6 国際会議録 Sub-0.35-ｦﾌm critical dimension metrology using atomic force microscopy

Wilder,K., Singh,B., Arnold,W.H.

SPIE-The International Society for Optical Engineering
12 国際会議録 Material Analysis by Ultrasonic Atomic Force Microscopy

Miyasaka, Chiaki, Jia, Lily, Tittmann, Bernhard R.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12