Blank Cover Image

Photosensitive Semiconductor Tips in a Scanning Tunneling Microscope

著者名:
掲載資料名:
Photons and local probes
シリーズ名:
NATO ASI series. Series E, Applied sciences
シリーズ巻号:
300
発行年:
1995
開始ページ:
275
終了ページ:
280
総ページ数:
6
出版情報:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792337096 [0792337093]
言語:
英語
請求記号:
N11482/300
資料種別:
国際会議録

類似資料:

1 国際会議録 Scanning tunneling microscope on homoepitaxial, boron-doped diamond films

S. Szuba, W.J.P. van Enckevort, H. van Kempen

Society of Photo-optical Instrumentation Engineers
7 国際会議録 Investigation On Laser-Induced Effects In Nanostructure Fabrication With Laser-Irradiated Scanning Tunneling Microscope Tips In Air Ambient

Mai, Z.H., Lu, Y.F., Song, W.D., Chim, W.K.

Materials Research Society
2 国際会議録 "Combined Photon Scanning Tunneling Microscope and Atomic Force Microscope using Silicon Nitrde Tips"

Moers P. H. M., Tack G. R., Noordman J. F. O., Segerink B. F., van Hulst F. N., Bolger B.

Kluwer Academic Publishers
8 国際会議録 STUDY OF SINGLE-ELECTRON TUNNELING IN POINT-CONTACT TUNNEL JUNCTIONS AT LOW TEMPERATURES

Smokers R. T. M., Bentum van P. J. M., Kempen van H.

Plenum Press
3 国際会議録 Low Voltage E-Beam Lithography with the Scanning Tunneling Microscope

Marrian C. R. K., Perkins F. K., Brandow S. L., Koloski T. S., Dobisz E. A., Calvert J. M.

Kluwer Academic Publishers
9 国際会議録 A New Mechanism for Laser-Frequency Mixing in a Scanning Tunneling Microscope

Sammet C., Krieger W., Volcker M., Walther H.

Kluwer Academic Publishers
4 国際会議録 Resonant scanning tunneling optical microscope

Bainier,C., Courjon,D.A., Salvi,J., Baida,F., Girard,C., Vigoureux,J.-M., Castiaux,A.

SPIE-The International Society for Optical Engineering
10 国際会議録 CROSS-SECTIONAL SCANNING TUNNELING MICROSCOPY OF III-V SEMICONDUCTOR STRUCTURES

Feenstra, R. M., Vaterlaus, A., Woodall, J. M., Collins, D. A., McGill, T. C.

MRS - Materials Research Society
5 国際会議録 The Tetrahedral Tip as a Probe for Scanning Near-Field Optical and for Scanning Tunneling Microscopy

Koglin J., Fischer C. U., Brzoska D. K., Gohde W., Fuchs H.

Kluwer Academic Publishers
11 国際会議録 Electrochemical Deposition of Metal Nano-Disk Structures using the Scanning Tunneling Microscope

Li W., Duong T., Virtanen A. J., Penner M. R.

Kluwer Academic Publishers
6 国際会議録 Roughening of Au(111) Surfaces During Ion Beam Erosion: A Scanning Tunneling Microscope and X-ray Diffraction Study

Judy, A., Murty, M. V. Ramana, Butler, E., Pomeroy, J., Cooper, B. H., Woll, A. R., Brock, J. D., Kycia, S., Headrick, …

MRS - Materials Research Society
12 国際会議録 Combined interference and scanning force microscope

Danzebrink, H. U., Tyrrell, J. W. G., Dal Savio, C., Kruger-Sehm, R.

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12