Blank Cover Image

Characterization of Normal Law by Constancy of Regression

著者名:
Khatri G. C.  
掲載資料名:
A modern course on statistical distributions in scientific work : proceedings of the NATO Advanced Study Institute held at the University of Calgary, Calgary, Alberta, Canada, July 29-August 10, 1974
シリーズ名:
NATO ASI series. Series C, Mathematical and physical sciences
シリーズ巻号:
17
発行年:
1975
パート:
3
開始ページ:
199
終了ページ:
209
総ページ数:
11
出版情報:
Dordrecht, Holland: D. Reidel
ISSN:
02582023
ISBN:
9789027706096 [9027706093]
言語:
英語
請求記号:
N11480/17
資料種別:
国際会議録

類似資料:

Kirose, G., Khatri, H.

SPIE - The International Society of Optical Engineering

Villette, S., Bourg-Heckly, G., Pigaglio, S., Validire, P., Grichine, A., Vever-Bizet, C.

SPIE-The International Society for Optical Engineering

Khatri H., Le C.

SPIE - The International Society of Optical Engineering

P. Katta, L. Khatri, R.D. Ramsier, G.G. Chase

American Institute of Chemical Engineers

H. Khatri, C. Le

SPIE - The International Society of Optical Engineering

P. Katta, L. Khatri, R.D. Ramsier, G.G. Chase

American Institute of Chemical Engineers

Wang,Z., Kun,C., Ma,Y., Chen,B., Cao,J., Zhou,Z., Chen,X., Michette,A.G.

SPIE-The International Society for Optical Engineering

5 国際会議録 Bootstrapping color constancy

Funt,B.V., Cardei,V.C.

SPIE - The International Society for Optical Engineering

Khatri, H.C., Kirose, G., Ranney, K., Innocenti, R.

SPIE - The International Society of Optical Engineering

Jourlin, Y., Tishchenko, A.V., Pedri, C., Zanzal, A.G., Unruh, J.

SPIE - The International Society of Optical Engineering

Castro,C.Di, Castellani,C., Metzner,W.

Kluwer Academic Publishers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12