Comparative characterization of highly oriented pyrolytic graphite by means of diffraction to topography

Comparative characterization of highly oriented pyrolytic graphite by means of diffraction to topography

著者名:

Tuffanelli,A. ( Univ.degli Studi di Ferrara(Italy)and INFN )

掲載資料名:

X-ray optics design, performance, and applications : 20-21 July 1999, Denver, Colorado

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3773

発行年:

1999

開始ページ:

192

終了ページ:

198

出版情報:

Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819432599 [0819432598]

言語:

英語

請求記号:

P63600/3773

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018091
シリーズID:	PA00000029
会議名:	Optics & Photonics : X-ray optics design, performance, and applications
回次:	1999
会議開催地:	Denver, CO, USA
会議開催年:	1999.07.20-1999.07.21

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