Sensitivity improvements in uncooled microbolometer FPAs | 東京工業大学附属図書館文献データベース

Blank Cover Image

Sensitivity improvements in uncooled microbolometer FPAs

著者名:

Radford,W.A. ( Raytheon Infrared Ctr.of Excellence )

さらに 7 件

掲載資料名:

Infrared technology and applications XXV : 5-9 April 1999, Orlando, Florida

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3698

発行年:

1999

開始ページ:

119

終了ページ:

130

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819431721 [0819431729]

言語:

英語

請求記号:

P63600/3698

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018084
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Infrared technology and applications
回次:	1999 : 25th
会議開催地:	Orlando, FL, USA
会議開催年:	1999.04.05-1999.04.09

類似資料:

1 国際会議録 Microbolometer uncooled infrared camera with 20-mK NETD Radford,W.A., Murphy,D.F., Finch,A., Kennedy,A., Kojiro,J.K., Ray,M., Wyles,R., Coda,R., Moody,E.A., Baur,S. SPIE-The International Society for Optical Engineering	7 国際会議録 320｡ﾟ240 microbolometer focal plane array for uncooled applications Radford,W.A., Murphy,D., Ray,M., Propst,S.H., Kennedy,A., Soch,K.L., Coda,R., Lung,G., Moody,E.A., Gleichman,D. SPIE-The International Society for Optical Engineering
2 国際会議録 Microbolometer uncooled infrared camera with 20 mK NETD Radford, W., Wyles, R., Wyles, J., Varesi, J., Ray, M., Murphy, D., Kennedy, A., Finch, A., Moody, E., Cheung, F., Coda, … SPIE	8 国際会議録 High-sensitivity 25-μm microbolometer FPAs Murphy, D.F., Ray, M., Wyles, R., Asbrock, J.F., Lum, N.A., Wyles,J., Hewitt, C., Kennedy, A., Van Lue, D., Anderson, … SPIE-The International Society for Optical Engineering
3 国際会議録 High-sensitivity (25-μm pitch) microbolometer FPAs and application development Murphy,D.F., Ray,M., Wyles,R., Asbrock,J.F., Lum,N.A., Kennedy,A., Wyles,J., Hewitt,C., Graham,G.E., Radford,W.A., … SPIE-The International Society for Optical Engineering	9 国際会議録 High-sensitivity (25-μm pitch) microbolometer FPAs Murphy,D.F., Ray,M., Wyles,R., Asbrock,J.F., Lum,N.A., Kennedy,A., Wyles,J., Hewitt,C., Graham,G.E., Horikiri,T., … SPIE-The International Society for Optical Engineering
4 国際会議録 Resolution and sensitivity improvements for VOx microbolometer FPAs Murphy, D.F., Kennedy, A., Ray, M., Wyles, R., Wyles, J., Asbrock, J.F., Hewitt, C., Lue, D.V., Sessler, T., Anderson, … SPIE-The International Society for Optical Engineering	10 国際会議録 High-sensitivity 25-μm microbolometer FPAs (Invited Paper) Murphy, D.F., Ray, M., Wyles, R., Asbrock, J.F., Lum, N.A,, Wyles, J., Hewitt, C., Kennedy, A., Van Lue, D., Anderson, … SPIE-The International Society for Optical Engineering
5 国際会議録 320｡ﾟ240 silicon microbolometer uncooled IR FPAs with on-chip offset correction Radford,W.A., Murphy,D., Ray,M., Propst,S.H., Kennedy,A., Kojiro,J.K., Woolaway,J.T., Soch,K.L., Coda,R., Lung,G., … SPIE-The International Society for Optical Engineering	11 国際会議録 Low-Cost Microsensors Program Anderson,J.S., Bradley,D., Chin,R., Radford,W.A., Kennedy,A., Murphy,D.F., Ray,M., Wyles,R., Brown,J.C., Newsome,G.W. SPIE - The International Society for Optical Engineering
6 国際会議録 Performance improvements for VOx microbolometer FPAs Murphy, D.F., Ray, M., Wyles, J., Asbrock, J.F., Hewitt, C., Wyles, R., Gordon, E., Sessler, T., Kennedy, A., Baur, … SPIE - The International Society of Optical Engineering	12 国際会議録 Integrated imaging sensors Anderson,J.S., Kostrzewa,T., Cook,L.G., Baker,G., Radford,W.A., Jack,M.D., Finch,A., Kennedy,A., Kojiro,J.K., … SPIE-The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12